XFEL crystal structure of the reduced form of F87A/F393H P450BM3 with N-enanthyl-L-prolyl-L-phenylalanine in complex with styrene
Serial Crystallography (SX)
Starting Model(s)
Initial Refinement Model(s) |
---|
Type | Source | Accession Code | Details |
---|
|
experimental model | PDB | 6K58 | |
Crystallization
Crystalization Experiments |
---|
ID | Method | pH | Temperature | Details |
---|
1 | BATCH MODE | 7.4 | 277 | 50 mM Tris-HCl buffer, 120 mM MgCl2, 16-18% PEG 8000, 200 uM N-Enanthyl-L-Prolyl-L-Phenylalanine, 1%(v/v) styrene |
Crystal Properties |
---|
Matthews coefficient | Solvent content |
---|
2.71 | 54.67 |
Crystal Data
Unit Cell |
---|
Length ( ? ) | Angle ( ? ) |
---|
a = 58.86 | ¦Á = 90 |
b = 128.49 | ¦Â = 90 |
c = 149.51 | ¦Ã = 90 |
Symmetry |
---|
Space Group | P 21 21 21 |
---|
Diffraction
Diffraction Experiment |
---|
ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|
1 | 1 | x-ray | 100 | CCD | RAYONIX MX300-HS | | 2022-12-09 | M | SINGLE WAVELENGTH |
Radiation Source |
---|
ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|
1 | FREE ELECTRON LASER | SACLA BEAMLINE BL2 | 0.9539 | SACLA | BL2 |
Serial Crystallography
Sample delivery method |
---|
Diffraction ID | Description | Sample Delivery Method |
---|
1 | Fixed-target | fixed target |
Fixed Target |
---|
Diffraction ID | Description | Sample Holding | Support Base | Motion control | Details | Sample Solvent |
---|
1 | microcrystals were mounted on mesh loop and flash-frozen by liquid nitrogen | polyimide film | SPINE magnet base | stepper motors | | 125 mM Tris-HCl (pH 8.3), 14% w/v PEG 8000, 60 mM MgCl2, saturated styrene, and 30% glycerol |
Measurement |
---|
Diffraction ID | Pulse Duration | Pulse Repetition Rate | Focal Spot Size | Pulse Energy | Photons Per Pulse |
---|
1 | 10 (fs) | 30 | 19.313 | 13 (KeV) | |
Data Reduction |
---|
Diffraction ID | Frames Indexed | Crystal Hits | Frames Indexed | Latices Merged |
---|
1 | 14685 | 21740 | 14685 | |
Data Collection
Overall |
---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot |
---|
1 | 1.6 | 10 | 100 | 0.956 | 4.88 | 93.9 | | 149341 | | | |
Highest Resolution Shell |
---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) |
---|
1 | 1.6 | 1.61 | | | 0.421 | 1.35 | | |
Refinement
Statistics |
---|
Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B |
---|
X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | FREE R-VALUE | 1.6 | 10 | 1.34 | 149188 | 7477 | 99.96 | 0.1852 | 0.1838 | 0.1838 | 0.2138 | 0.2139 | |
Temperature Factor Modeling |
---|
Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] |
---|
| | | | | |
RMS Deviations |
---|
Key | Refinement Restraint Deviation |
---|
f_dihedral_angle_d | 8.989 |
f_angle_d | 0.978 |
f_chiral_restr | 0.053 |
f_plane_restr | 0.009 |
f_bond_d | 0.007 |
Non-Hydrogen Atoms Used in Refinement |
---|
Non-Hydrogen Atoms | Number |
---|
Protein Atoms | 7328 |
Nucleic Acid Atoms | |
Solvent Atoms | 783 |
Heterogen Atoms | 172 |
Software
Software |
---|
Software Name | Purpose |
---|
PHENIX | refinement |
CrystFEL | data reduction |
CrystFEL | data scaling |
PHENIX | phasing |